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Achieving Complete Structural Test Coverage in Embedded Systems Using Trace-Based Monitoring

TitleAchieving Complete Structural Test Coverage in Embedded Systems Using Trace-Based Monitoring
Publication TypeConference Paper
Year of Publication2024
AuthorsWeiss, A, Schulz, A, Heininger, M, Sachenbacher, M, Leucker, M
EditorPill, I, Natan, A, Wotawa, F
Conference Name35th International Conference on Principles of Diagnosis and Resilient Systems (DX 2024)
SeriesOpen Access Series in Informatics (OASIcs)
Volume125
PublisherSchloss Dagstuhl – Leibniz-Zentrum für Informatik
Conference LocationDagstuhl, Germany
ISBN Number978-3-95977-356-0
URLhttps://drops.dagstuhl.de/entities/document/10.4230/OASIcs.DX.2024.19
DOI10.4230/OASIcs.DX.2024.19
Bibtex: 
@inproceedings {1457,
	title = {Achieving Complete Structural Test Coverage in Embedded Systems Using Trace-Based Monitoring},
	booktitle = {35th International Conference on Principles of Diagnosis and Resilient Systems (DX 2024)},
	series = {Open Access Series in Informatics (OASIcs)},
	volume = {125},
	year = {2024},
	publisher = {Schloss Dagstuhl {\textendash} Leibniz-Zentrum f{\"u}r Informatik},
	organization = {Schloss Dagstuhl {\textendash} Leibniz-Zentrum f{\"u}r Informatik},
	address = {Dagstuhl, Germany},
	isbn = {978-3-95977-356-0},
	doi = {10.4230/OASIcs.DX.2024.19},
	url = {https://drops.dagstuhl.de/entities/document/10.4230/OASIcs.DX.2024.19},
	author = {Weiss, Alexander and Schulz, Albert and Heininger, Martin and Sachenbacher, Martin and Leucker, Martin},
	editor = {Pill, Ingo and Natan, Avraham and Wotawa, Franz}
}